The Microscopy Laboratory is located in Percival Stern Hall, suite 3001-3 and 1032. CIF staff members are available to assist users with morphological analysis of both biological and material science samples. They are also available to operate the instrumentation and to consult with researchers. This lab houses a number of common pieces of sample preparation equipment, including an ultramicrotome, a heavy-metal sputter coater, and a carbon-sublimator. Several electron microscopes are equipped with cryo-stages.
FEI Tecnai G2 F30 Twin
The Tecnai G2 F30 TWIN is a 300 kV / FEG Transmission Electron Microscope. It is a high-resolution microscope optimized for complete and versatile performance with high-tilt applications such as diffraction experiments and tomography for a cross-disciplinary laboratory such as a joint Materials Science/Life Science establishment. The relatively large pole-piece gap allows for a variety of stages and detectors to be fitted in this instrument. With its FEG source, fine probe techniques (such as STEM with an HAADF detector) can be performed with ease.
TEM Point Resolution: 0.24 nm
TEM Line Resolution: 0.144 nm
Information Limit: 0.15 nm
The Tecnai G2 TEM's are equipped with Gatan cryogenic TEM system with FEI low dose capability, the most advanced SDD EDS system, FEI's total solution for 3D imaging, FEI Eagle 4k high sensitivity CCD camera and the Windows XP operating system. In the unique Tecnai concept, all microscope components, like the electron gun, the optical elements, the vacuum system and the stage, are completely digitally controlled. The task-oriented user interface allows users to automatically recall all optimized operating conditions including lens settings, gun parameters, optical alignments, aperture alignments (optional) for all the different techniques such as TEM, STEM, CBED, Diffraction and Analysis.
A variable pressure Hitachi 3400 electron microscope was installed in 2005.
In 2005, the CIF installed a Hitachi 4800 High-resolution SEM.
Confocal microscopy utilizes lasers and advanced optics to produce very high quality images of specimens. The technique collects only light for a specified plane and removes interfering light. The image can be collected in the x-y and the z dimensions. Specimens are often labeled with a fluorophore. The CIF installed a Nikon A1 confocal microscope in Stern 3003 in November 2013.
This microscope has the following features:
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